"Embedded DRAM in 45-nm Technology and Beyond."

Darren Anand et al. (2011)

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DOI: 10.1109/MDT.2011.2

access: closed

type: Journal Article

metadata version: 2020-05-17

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Darren Anand, Kevin W. Gorman, Mark Jacunski, Adrian Paparelli:
Embedded DRAM in 45-nm Technology and Beyond. IEEE Des. Test Comput. 28(1): 14-21 (2011)

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