"Learning Assisted Side Channel Delay Test for Detection of Recycled ICs."

Ashkan Vakil et al. (2020)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2020-11-02

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-2010-12704
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  - https://dblp.org/rec/journals/corr/abs-2010-12704
Ashkan Vakil, Farzad Niknia, Ali Mirzaeian, Avesta Sasan, Naghmeh Karimi:
Learning Assisted Side Channel Delay Test for Detection of Recycled ICs. CoRR abs/2010.12704 (2020)

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