"Experimental investigation of the gate voltage range of negative ..."

Mengxuan Yang et al. (2022)

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DOI: 10.1007/S11432-021-3268-0

access: closed

type: Journal Article

metadata version: 2024-06-05

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Mengxuan Yang, Qianqian Huang, Chang Su, Liang Chen, Yangyuan Wang, Ru Huang:
Experimental investigation of the gate voltage range of negative differential capacitance in ferroelectric transistors. Sci. China Inf. Sci. 65(6): 1-2 (2022)

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