"Effects of non-fatal electrostatic discharge on the threshold voltage ..."

Hei Wong, Shurong Dong, Zehua Chen (2022)

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DOI: 10.1007/S11432-020-3197-8

access: closed

type: Journal Article

metadata version: 2022-06-23

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Hei Wong, Shurong Dong, Zehua Chen:
Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices. Sci. China Inf. Sci. 65(2) (2022)

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