"Experimental Determination of Interface Trap Density and Fixed Positive ..."

Susanna Yu, Marvin H. White, Anant K. Agarwal (2021)

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DOI: 10.1109/ACCESS.2021.3124706

access: open

type: Journal Article

metadata version: 2021-12-15

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Susanna Yu, Marvin H. White, Anant K. Agarwal:
Experimental Determination of Interface Trap Density and Fixed Positive Oxide Charge in Commercial 4H-SiC Power MOSFETs. IEEE Access 9: 149118-149124 (2021)

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