"Analysis of High-Failure Mechanism Based on Gate-Controlled Device for ..."

Yang Wang et al. (2020)

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DOI: 10.1109/ACCESS.2020.3042313

access: open

type: Journal Article

metadata version: 2025-03-25

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Yang Wang, Xiangliang Jin, Yan Peng, Jun Luo, Zeyu Zhong, Jun Yang:
Analysis of High-Failure Mechanism Based on Gate-Controlled Device for Electro-Static Discharge Protection. IEEE Access 8: 217213-217221 (2020)

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