"On the Low-Frequency Noise Characterization of Z²-FET Devices."

Carlos Marquez et al. (2019)

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DOI: 10.1109/ACCESS.2019.2907062

access: open

type: Journal Article

metadata version: 2020-12-29

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Carlos Marquez, Carlos Navarro, Santiago Navarro, José Luis Padilla, Luca Donetti, Carlos Sampedro, Philippe Galy, Yong-Tae Kim, Francisco Gámiz:
On the Low-Frequency Noise Characterization of Z²-FET Devices. IEEE Access 7: 42551-42556 (2019)

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