"Reliability Prediction of Highly Scaled MOSFET Devices via Fractal ..."

Seong-Joon Kim, Man Soo Kim, Suk Joo Bae (2019)

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DOI: 10.1109/ACCESS.2019.2944955

access: open

type: Journal Article

metadata version: 2019-11-07

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Seong-Joon Kim, Man Soo Kim, Suk Joo Bae:
Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects. IEEE Access 7: 143160-143168 (2019)

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