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2020 – today
- 2022
[c1]Heeryon Cho, Woo Kyu Kang, Youn-Soo Park, Sun Geu Chae, Seong-Joon Kim:
Multi-Label Facial Emotion Recognition Using Korean Drama Video Clips. BigComp 2022: 215-221
2010 – 2019
- 2019
- [j10]Seong-Joon Kim, Man Soo Kim, Suk Joo Bae
:
Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects. IEEE Access 7: 143160-143168 (2019) - [j9]So-Ra Ahn, Seong-Joon Kim:
Assessment of watershed health, vulnerability and resilience for determining protection and restoration Priorities. Environ. Model. Softw. 122 (2019) - [j8]Seong-Joon Kim, Byeong Min Mun, Suk Joo Bae:
A cost-driven reliability demonstration plan based on accelerated degradation tests. Reliab. Eng. Syst. Saf. 183: 226-239 (2019) - 2016
- [j7]Suk Joo Bae, Tao Yuan, Seong-Joon Kim:
Bayesian degradation modeling for reliability prediction of organic light-emitting diodes. J. Comput. Sci. 17: 117-125 (2016) - [j6]Seong-Joon Kim, Tao Yuan, Suk Joo Bae:
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides. IEEE Trans. Reliab. 65(1): 263-271 (2016) - 2013
- [j5]Seong-Joon Kim, Suk Joo Bae:
Cost-effective degradation test plan for a nonlinear random-coefficients model. Reliab. Eng. Syst. Saf. 110: 68-79 (2013) - [j4]Seong-Joon Kim, Impyeong Lee, Yong Joon Kwon:
Simulation of a Geiger-Mode Imaging LADAR System for Performance Assessment. Sensors 13(7): 8461-8489 (2013) - 2010
- [j3]Thanh D. B. Nguyen, Young-Il Lim, Won-Hyeon Eom, Seong-Joon Kim, Kyung-Seun Yoo:
Experiment and CFD simulation of hybrid SNCR-SCR using urea solution in a pilot-scale reactor. Comput. Chem. Eng. 34(10): 1580-1589 (2010)
2000 – 2009
- 2008
- [j2]Suk Joo Bae, Seong-Joon Kim, Man Soo Kim, Bae Jin Lee, Chang Wook Kang:
Degradation Analysis of Nano-Contamination in Plasma Display Panels. IEEE Trans. Reliab. 57(2): 222-229 (2008) - 2007
- [j1]Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam:
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. IEEE Trans. Reliab. 56(3): 392-400 (2007)
Coauthor Index
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