"ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for ..."

Donghyun Han et al. (2021)

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DOI: 10.1109/ACCESS.2021.3115496

access: open

type: Journal Article

metadata version: 2024-02-27

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Donghyun Han, Hayoung Lee, Seungtaek Lee, Sungho Kang:
ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory. IEEE Access 9: 133274-133288 (2021)

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