"Hierarchical Statistical Inference Model for Specification Based Testing ..."

Heebyung Yoon et al. (1998)

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DOI: 10.1109/VTEST.1998.670862

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi:
Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. VTS 1998: 145-151

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