"Test Generation for Accurate Prediction of Analog Specifications."

Ramakrishna Voorakaranam, Abhijit Chatterjee (2000)

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DOI: 10.1109/VTEST.2000.843837

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ramakrishna Voorakaranam, Abhijit Chatterjee:
Test Generation for Accurate Prediction of Analog Specifications. VTS 2000: 137-142

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