"ATTEST: Application-Agnostic Testing of a Novel Transistor-Level ..."

Mustafa Munawar Shihab et al. (2020)

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DOI: 10.1109/VTS48691.2020.9107561

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Mustafa Munawar Shihab, Bharath Ramanidharan, Suraag Sunil Tellakula, Gaurav Rajavendra Reddy, Jingxiang Tian, Carl Sechen, Yiorgos Makris:
ATTEST: Application-Agnostic Testing of a Novel Transistor-Level Programmable Fabric. VTS 2020: 1-6

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