"Behavior of faulty single BJT BiCMOS logic gates."

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana (1992)

Details and statistics

DOI: 10.1109/VTEST.1992.232772

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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