"Excitation, Observation, and ELF-MD: Optimization Criteria for High ..."

Jennifer Dworak et al. (2004)

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DOI: 10.1109/VTEST.2004.1299219

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer:
Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. VTS 2004: 9-15

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