"Flip-flop clustering based trace signal selection for post-silicon debug."

Yun Cheng et al. (2017)

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DOI: 10.1109/VTS.2017.7928929

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-11

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  persistent URL:
  - https://dblp.org/rec/conf/vts/ChengLWGL017
Yun Cheng, Huawei Li, Ying Wang, Yingke Gao, Bo Liu, Xiaowei Li:
Flip-flop clustering based trace signal selection for post-silicon debug. VTS 2017: 1-6

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