"Power Dissipation During Testing: Should We Worry About it?"

Vishwani D. Agrawal et al. (1997)

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DOI: 10.1109/VTS.1997.10012

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian:
Power Dissipation During Testing: Should We Worry About it? VTS 1997: 456-457

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