"A Silicon Testing Strategy for Pulse-Width Failures."

Srinivas Vooka et al. (2012)

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DOI: 10.1109/VLSID.2012.96

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Srinivas Vooka, Khushboo Agarwal, Abhijeet Shrivastava, Pranav Murthy, Ramakrishnan Venkatraman:
A Silicon Testing Strategy for Pulse-Width Failures. VLSI Design 2012: 352-357

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