"Hierarchical Test Generation for Systems On a Chip."

Raghuram S. Tupuri, Jacob A. Abraham, Daniel G. Saab (2000)

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DOI: 10.1109/ICVD.2000.812609

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Raghuram S. Tupuri, Jacob A. Abraham, Daniel G. Saab:
Hierarchical Test Generation for Systems On a Chip. VLSI Design 2000: 198-

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