"Test Pattern Generation for Power Supply Droop Faults."

Debasis Mitra et al. (2006)

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DOI: 10.1109/VLSID.2006.158

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Debasis Mitra, Subhasis Bhattacharjee, Susmita Sur-Kolay, Bhargab B. Bhattacharya, Sujit T. Zachariah, Sandip Kundu:
Test Pattern Generation for Power Supply Droop Faults. VLSI Design 2006: 343-348

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