"Improving the Performance of Automatic Sequential Test Generation by ..."

Loganathan Lingappan, Niraj K. Jha (2006)

> Home

Details and statistics

DOI: 10.1109/VLSID.2006.104

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/LingappanJ06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/LingappanJ06
Loganathan Lingappan, Niraj K. Jha:
Improving the Performance of Automatic Sequential Test Generation by Targeting Hard-to-Test Faults. VLSI Design 2006: 431-436

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.