"Towards Single Pin Scan for Extremely Low Pin Count Test."

Mudasir S. Kawoosa et al. (2018)

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DOI: 10.1109/VLSID.2018.44

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Mudasir S. Kawoosa, Rajesh K. Mittal, Maheedhar Jalasuthram, Rubin A. Parekhji:
Towards Single Pin Scan for Extremely Low Pin Count Test. VLSID 2018: 97-102

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