"Direct Temperature Measurement for VLSI Circuits and 3-D Modeling of ..."

Rajiv V. Joshi et al. (2005)

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DOI: 10.1109/ICVD.2005.82

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Rajiv V. Joshi, S. S. Kang, N. Zamdmar, Anda Mocuta, Ching-Te Chuang, J. A. Pascual-Gutiérrez:
Direct Temperature Measurement for VLSI Circuits and 3-D Modeling of Self-Heating in Sub-0.13 mum SOI Technologies. VLSI Design 2005: 697-702

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