"Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A ..."

Abhijit Chatterjee, Naveena Nagi (1997)

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DOI: 10.1109/ICVD.1997.568158

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Abhijit Chatterjee, Naveena Nagi:
Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial. VLSI Design 1997: 388-392

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