"Deriving Signal Constraints to Accelerate Sequential Test Generation."

Srimat T. Chakradhar, Vijay Gangaram, Steven G. Rothweiler (1997)

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DOI: 10.1109/ICVD.1997.568182

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Srimat T. Chakradhar, Vijay Gangaram, Steven G. Rothweiler:
Deriving Signal Constraints to Accelerate Sequential Test Generation. VLSI Design 1997: 488-494

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