"An Approach to Minimize Testability Overhead for BILBO based ..."

Anupam Basu et al. (1992)

> Home

Details and statistics

DOI: 10.1109/ICVD.1992.658084

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/BasuWBM92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/BasuWBM92
Anupam Basu, Thomas Charles Wilson, Dilip K. Banerji, Jayanti C. Majithia:
An Approach to Minimize Testability Overhead for BILBO based Built-In-Self-Test. VLSI Design 1992: 354-355

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.