"Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded ..."

Yukio Hayakawa et al. (2015)

> Home

Details and statistics

DOI: 10.1109/VLSIC.2015.7231381

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsic/HayakawaHYBVVWC15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsic/HayakawaHYBVVWC15
Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, W. Boullart, E. Vecchio, T. Vandeweyer, T. Witters, D. Crotti, M. Jurczak, S. Fujii, S. Ito, Y. Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda:
Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application. VLSIC 2015: 14-

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.