"Statistical Analysis of Normality of Systematic and Random Variability of ..."

Gustavo Neuberger et al. (2007)

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DOI: 10.1007/978-0-387-89558-1_1

access: open

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  - conf/vlsi/NeubergerWKR07
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  - https://dblp.org/rec/conf/vlsi/NeubergerWKR07
Gustavo Neuberger, Gilson I. Wirth, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis:
Statistical Analysis of Normality of Systematic and Random Variability of Flip-Flop Race Immunity in 130nm and 90nm CMOS Technologies. VLSI-SoC (Selected Papers) 2007: 1-16

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