"Statistical analysis of systematic and random variability of flip-flop ..."

Gustavo Neuberger et al. (2007)

> Home

Details and statistics

DOI: 10.1109/VLSISOC.2007.4402476

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi/NeubergerKRWBP07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi/NeubergerKRWBP07
Gustavo Neuberger, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis, Gilson I. Wirth, Ralf Brederlow, Christian Pacha:
Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies. VLSI-SoC 2007: 78-83

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.