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"Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs."

Thiago Santos Copetti et al. (2017)

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DOI: 10.1007/978-3-030-15663-3_2

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-17

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  dblp key:
  - conf/vlsi/CopettiMPB17
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Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) 2017: 22-45

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