"Efficient test length reduction techniques for interposer-based 2.5D ICs."

Shyue-Kung Lu et al. (2014)

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DOI: 10.1109/VLSI-DAT.2014.6834878

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Shyue-Kung Lu, Huai-Min Li, Masaki Hashizume, Jin-Hua Hong, Zheng-Ru Tsai:
Efficient test length reduction techniques for interposer-based 2.5D ICs. VLSI-DAT 2014: 1-4

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