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"Improving and optimizing reliability in future technologies with ..."

Barry P. Linder et al. (2013)

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DOI: 10.1109/VLDI-DAT.2013.6533828

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Barry P. Linder, Eduard Cartier, S. Krishnan, Ernest Y. Wu:
Improving and optimizing reliability in future technologies with high-κ dielectrics. VLSI-DAT 2013: 1-4

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