"On minimization of test power through modified scan flip-flop."

Satyadev Ahlawat, Jaynarayan T. Tudu (2016)

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DOI: 10.1109/ISVDAT.2016.8064878

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Satyadev Ahlawat, Jaynarayan T. Tudu:
On minimization of test power through modified scan flip-flop. VDAT 2016: 1-6

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