"Structural, Syntactic, and Statistical Pattern Recognition, Joint IAPR ..."

Dit-Yan Yeung et al. (2006)

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DOI: 10.1007/11815921

access: closed

type: Editorship

metadata version: 2019-05-14

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Dit-Yan Yeung, James T. Kwok, Ana L. N. Fred, Fabio Roli, Dick de Ridder:
Structural, Syntactic, and Statistical Pattern Recognition, Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings. Lecture Notes in Computer Science 4109, Springer 2006, ISBN 3-540-37236-9 [contents]

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