"A register-transfer level testability analyzer."

Yen-An Chen et al. (2011)

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DOI: 10.1109/SOCC.2011.6085107

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Yen-An Chen, Chun-Yao Wang, Ching-Yi Huang, Hsiu-Yi Lin:
A register-transfer level testability analyzer. SoCC 2011: 219-224

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