"A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm ..."

F. J. Rubio-Barbero et al. (2023)

> Home

Details and statistics

DOI: 10.1109/SMACD58065.2023.10192247

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/smacd/RubioBarberoCCRF23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/smacd/RubioBarberoCCRF23
F. J. Rubio-Barbero, Eros Camacho-Ruiz, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF. SMACD 2023: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.