"Parametric Yield Estimation for Deep Sub- Micron VLSI Circuits."

Jochen A. G. Jess (2002)

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DOI: 10.5555/827246.827367

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-10

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Jochen A. G. Jess:
Parametric Yield Estimation for Deep Sub- Micron VLSI Circuits. SBCCI 2002: 387

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