"Test Pattern Generation Effort Evaluation of Reversible Circuits."

Abhoy Kole et al. (2017)

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DOI: 10.1007/978-3-319-59936-6_13

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-26

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Abhoy Kole, Robert Wille, Kamalika Datta, Indranil Sengupta:
Test Pattern Generation Effort Evaluation of Reversible Circuits. RC 2017: 162-175

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