"Measurement of Ion Motion Caused by Laser-Induced Stray Charges on ..."

Changhyun Jung et al. (2021)

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DOI: 10.1109/QCE52317.2021.00064

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Changhyun Jung, Woojun Lee, Junho Jeong, Taehyun Kim, Dong-Il Dan Cho:
Measurement of Ion Motion Caused by Laser-Induced Stray Charges on Microfabricated Ion Trap Chip Surfaces. QCE 2021: 431-432

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