"Methodologies for Device Characterization in Cryogenic Temperatures."

Noam Roknian et al. (2024)

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DOI: 10.1109/PRIME61930.2024.10559674

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-04

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Noam Roknian, Yonatan Shoshan, Inbal Stanger, Menachem Goldzweig, Yoav Weizmann, Adam Teman, Edoardo Charbon, Alexander Fish:
Methodologies for Device Characterization in Cryogenic Temperatures. PRIME 2024: 1-4

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