"Analyzing Reliability of Memory Sub-systems with Double-Chipkill ..."

Xun Jian et al. (2013)

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DOI: 10.1109/PRDC.2013.18

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-14

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Xun Jian, Nathan DeBardeleben, Sean Blanchard, Vilas Sridharan, Rakesh Kumar:
Analyzing Reliability of Memory Sub-systems with Double-Chipkill Detect/Correct. PRDC 2013: 88-97

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