"Impact of the Trap Attributes on the Gate Leakage Mechanisms in a 2D ..."

Cristina Medina-Bailon et al. (2018)

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DOI: 10.1007/978-3-030-10692-8_30

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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Cristina Medina-Bailon, Toufik Sadi, Carlos Sampedro, José Luis Padilla, Luca Donetti, Vihar P. Georgiev, Francisco Gámiz, Asen Asenov:
Impact of the Trap Attributes on the Gate Leakage Mechanisms in a 2D MS-EMC Nanodevice Simulator. NMA 2018: 273-280

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