default search action
"Discussion and analysis of Au/a-Si contact resistance in MEMS/NEMS devices."
Fengshan Fu et al. (2015)
- Fengshan Fu, Fang Yang, Wei Wang, Xian Huang, Jun He, Li Zhang, Taotao Guan, Rui Li, Dacheng Zhang:
Discussion and analysis of Au/a-Si contact resistance in MEMS/NEMS devices. NEMS 2015: 593-596
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.