"Satisfiability-Based Analysis of Failing Traces during Post-silicon Debug."

Amin Vali, Nicola Nicolici (2015)

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DOI: 10.1109/NATW.2015.16

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Amin Vali, Nicola Nicolici:
Satisfiability-Based Analysis of Failing Traces during Post-silicon Debug. NATW 2015: 17-22

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