"Multivalued Logic for Reduced Pin Count and Multi-site SoC Testing."

Baohu Li, Vishwani D. Agrawal (2015)

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DOI: 10.1109/NATW.2015.15

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Baohu Li, Vishwani D. Agrawal:
Multivalued Logic for Reduced Pin Count and Multi-site SoC Testing. NATW 2015: 49-54

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