"Decreasing EEPROM Programming Bias With Negative Voltage, Reliability Impact."

Romain Laffont et al. (2002)

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DOI: 10.1109/MTDT.2002.1029781

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-17

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Romain Laffont, J. Razafindramora, Pierre Canet, Rachid Bouchakour, Jean-Michel Mirabel:
Decreasing EEPROM Programming Bias With Negative Voltage, Reliability Impact. MTDT 2002: 168-176

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