"AccMon: Automatically Detecting Memory-Related Bugs via Program ..."

Pin Zhou et al. (2004)

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DOI: 10.1109/MICRO.2004.3

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-31

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Pin Zhou, Wei Liu, Long Fei, Shan Lu, Feng Qin, Yuanyuan Zhou, Samuel P. Midkiff, Josep Torrellas:
AccMon: Automatically Detecting Memory-Related Bugs via Program Counter-Based Invariants. MICRO 2004: 269-280

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