"DeepTest: How Machine Learning Can Improve the Test of Embedded Systems."

Jens Bielefeldt et al. (2021)

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DOI: 10.1109/MECO52532.2021.9460182

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Jens Bielefeldt, Kai-Uwe Basener, Siddique Reza Khan, Mozhdeh Massah, Hans-Werner Wiesbrock, Stefan Scharoba, Michael Hübner:
DeepTest: How Machine Learning Can Improve the Test of Embedded Systems. MECO 2021: 1-6

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