"Towards an automatic generation of diagnostic in-field SBST for processor ..."

Mario Schölzel et al. (2013)

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DOI: 10.1109/LATW.2013.6562676

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/latw/ScholzelKRV13
Mario Schölzel, Tobias Koal, Stephanie Roder, Heinrich Theodor Vierhaus:
Towards an automatic generation of diagnostic in-field SBST for processor components. LATW 2013: 1-6

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