"Gate-level modelling of NBTI-induced delays under process variations."

Thiago Copetti et al. (2016)

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DOI: 10.1109/LATW.2016.7483343

access: closed

type: Conference or Workshop Paper

metadata version: 2021-09-03

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Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar:
Gate-level modelling of NBTI-induced delays under process variations. LATS 2016: 75-80

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